The XIS-6545DVS™ is an advanced X-Ray Inspection System (XIS) designed with dual imaging generators, allowing operators to examine objects and baggage from multiple angles simultaneously. This reduces potential blind spots and obstructions for operators, and each view can be reviewed independently using Astrophysics’ multi-colored, high-contrast screening software.
The system’s high-quality imaging enables higher throughput, meaning operators spend less time resolving false alarms and conducting manual inspections.